Search OEDI Data

Showing results 1 - 2 of 2.
Show results per page.
Order by:
Available Now:
Clear All Filters ×
Research Areas
Accessibility
Data Type
Organization
Source
"supply curves"×
Sandia National Laboratories×

SiC Diode Test Data

Fabricated SiC diodes are tested in the temperature range of 300 degrees C to 600 degrees C.
Gilbert, G. Sandia National Laboratories
Aug 01, 2014
1 Resources
0 Stars
Publicly accessible

EGS Collab: Hydraulic Fracturing Test Measurements on the 4100L of SURF

This package includes data from two days of testing at the Sanford Underground Research Facility (SURF) on the 4100 level. The tests were performed in borehole TV4100 in the battery charging alcove south of the Yates shaft. TV4100 is a vertical borehole ~50 meters deep. A series o...
Ingraham, M. et al Sandia National Laboratories
Aug 15, 2019
3 Resources
0 Stars
Publicly accessible